The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2002

Filed:

Apr. 12, 2000
Applicant:
Inventors:

Takuji Kurozumi, Miyanohigashi-machi, JP;

Kazuyuki Ikemoto, Miyanohigashi-machi, JP;

Assignee:

Horiba, Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/502 ;
U.S. Cl.
CPC ...
G01N 1/502 ;
Abstract

A laser beam optical adjusting mechanism for a particle size distribution measuring apparatus includes a light source to provide a laser beam for irradiating a sample cell and an optical detector unit for receiving an intensity pattern representing the impact of the laser beam on a cell. A mirror assembly is positioned adjacent the light source to reflect the laser beam to irradiate the sample cell. An actuator unit is provided for adjusting the mirror assembly to line an optical axis of the light source with an optical detector. The actuator unit can be automatically driven by a controller and can be of a compact configuration by the use of a pair of lever members that are pivotally supported and respectively driven by actuators.


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