The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2002

Filed:

Aug. 09, 2000
Applicant:
Inventors:

Kevin J. Klees, Hamlin, NY (US);

Thomas F. Powers, Webster, NY (US);

Craig A. Caprio, Rochester, NY (US);

Mitchell L. Wright, Rochester, NY (US);

Donald O. Bigelow, Webster, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 1/514 ; B41J 2/700 ;
U.S. Cl.
CPC ...
B41J 1/514 ; B41J 2/700 ;
Abstract

Apparatus for exposing reference calibration patches onto photosensitive medium, includes: a light source; a plurality of optical fibers, one fiber for each element to be exposed; a light collector having an input port for receiving light emitted by the light source and an output port for delivering light to one end of the optical fibers; a plurality of light attenuators located with respect to the optical fiber for individually attenuating the light transmitted by each fiber; a projection print head located at the other end of the optical fibers for directing light from the fiber onto the photosensitive medium; and a controller connected to the light source for measuring and controlling the light output of the light collector.


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