The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2002

Filed:

Aug. 10, 2001
Applicant:
Inventors:

Lance Todd Mucenieks, Boulder Creek, CA (US);

David Kent Bonds, Quincy, IL (US);

Assignee:

Spectrian Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03F 1/26 ;
U.S. Cl.
CPC ...
H03F 1/26 ;
Abstract

RF power amplifier distortion can be accurately measured in the presence of multi-frequency input signals, by using a swept local oscillator to tune RF input and output receivers. The power detected by the input receiver is compared with a threshold associated with the carrier. Whenever the power detected by the input receiver exceeds the threshold—indicating that the input receiver is tuned on carrier energy—the signal path through the output receiver is blanked. The sweeping action combined with selective blanking of the output receiver creates an adaptive notch filter, which allows for the direct measurement of low level distortion power in the presence of high power carriers. This distortion power is digitized and can be processed to control pre-distortion correction circuitry or gain/phase adjustment circuitry of a feed-forward error correction loop.


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