The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2002
Filed:
May. 25, 2000
Akishige Ito, Tokyo, JP;
Katsushi Ohta, Tokyo, JP;
Toshiyuki Yagi, Tokyo, JP;
Mitsuru Shinagawa, Isehara, JP;
Tadao Nagatsuma, Sagamihara, JP;
Junzo Yamada, Ebina, JP;
Other;
Abstract
A probe for an electro-optic sampling oscilloscope is provided, capable of obtaining an improved accuracy in measurement of the test measuring signals by controlling a temperature of an electro-optic element so as to be maintained at a constant such that the refractive index of the electro-optic element does not change due to the temperature change. The probe for the electro-optic sampling oscilloscope comprises a reflecting film at one end and a metal pin provided on the surface of the reflecting film such that the optical property of the electro-optic film changes according to an electric field applied through the metal pin. The probe further comprises a temperature detecting portion, disposed so as to contact with the electro-optic element, for detecting and outputting the temperature of the electro-optic element, a temperature adjusting portion, disposed so as to contact with the electro-optic element facing the temperature detecting portion about the electro-optic element, and a temperature controlling portion for controlling the temperature adjusting portion based on the result of the temperature detection.