The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2002

Filed:

Aug. 04, 2000
Applicant:
Inventor:

Makoto Watanabe, Niigata-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/312 ;
U.S. Cl.
CPC ...
G01R 3/312 ;
Abstract

A plurality of magnetic head devices are placed on different scanning regions in the radial direction of a disk-shaped recording medium. Each scanning region is slightly displaced from each of the other scanning regions in the radial direction of the recording medium. The plurality of magnetic head devices is tested.


Find Patent Forward Citations

Watanabe, Makoto. (2002). Method and apparatus for testing a plurality of magnetic head devices opposing a common surface of a magnetic disk (U.S. Patent No. 6407544). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6407544

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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