The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2002

Filed:

Dec. 18, 2000
Applicant:
Inventors:

Junji Tominaga, Tsukuba, JP;

Isamu Kuribayashi, Nagano, JP;

Makoto Takahashi, Nagano, JP;

Takashi Kikukawa, Nagano, JP;

Assignee:

TDK Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 3/02 ;
U.S. Cl.
CPC ...
B32B 3/02 ;
Abstract

A phase change optical recording medium has on a substrate a recording layer consisting essentially of a Sb base thin film and a reactive thin film. The Sb base thin film is formed by depositing a Sb base material containing at least 95 at % of Sb to a thickness of 70-150 Å. The reactive thin film is formed of a material which forms a phase change recording material when mixed with Sb. The reactive thin film is typically formed of an In—Ag—Te or Ge—Te material. Stable write/read characteristics are accomplished at the first overwriting, initializing operation is eliminated, and rewriting is impossible at the same linear velocity as recording.


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