The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2002

Filed:

Oct. 11, 2000
Applicant:
Inventors:

Dror Zur, Herzelia, IL;

Shimon Ullman, Rehovot, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61R 1/300 ;
U.S. Cl.
CPC ...
A61R 1/300 ;
Abstract

A micro-perimeter technique using a portable computer and a projector, and using two screening methods, multi-resolution static and bi-directional kinetic. The static method, as applied to a static test, starts with relatively low-resolutions, and only the unseen zones are selectively remapped under higher resolutions during successive iterations. The bi-directional kinetic method, as applied to a kinetic test, uses a response to a continuously moving target, and the unknown response delay is compensated for by an algorithm that merges the patient's response to measurements at the same visual location, but with opposite scanning directions. Offline visualization of the mapping results is performed automatically superimposed over the fundus image.


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