The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2002

Filed:

Sep. 21, 2000
Applicant:
Inventor:

Ming Lai, Dublin, CA (US);

Assignee:

Carl Zeiss, Inc., Thornwood, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 ;
U.S. Cl.
CPC ...
A61B 3/14 ;
Abstract

Wavefront refractor apparatus and method which records two Hartmann-Shack images simultaneously at different distances from the lenslet array. The two images recorded this way enable each focal spot to be associated with a lenslet forming the spot to identify “bad” spots, “ghost” spots, and to provide more accurate measurements for diverging or converging wavefronts.


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