The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2002
Filed:
May. 03, 1999
Kazunori Fujii, Tokyo, JP;
Mamoru Iguchi, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
In a production line simulator, an evaluation value of parameter adapted for real data (standard time as a processing period in processing a certain product by a certain production facility through a certain production process) computed at high reliability. From event reported from each production facility in a production line, a process period of the certain product by the certain production facility through the certain production process is derived for deriving the evaluation value on the basis of the derived process period. For deriving the evaluation value, an accumulated data in a is sorted sequential order of values. Then, a first center value is determined on the basis of result of sorting, and data on which an absolute value of a difference with the first center value becomes smaller is detected. A zone where number of the data to be detected exceeds half of all data number, is set. Then a new second center value of data is derived within the set zone, for comparing a difference between the second center value and the first center value with a convergence judgment reference value preliminarily set close to zero and determining whether the second center value can be regarded as the evaluation value on the basis of result of comparison. By this the evaluation value well reflecting distribution condition of live data can be obtained.