The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2002
Filed:
May. 17, 1999
Makoto Maruya, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
A curve length measuring device which processes image data obtained by the photographing of an object to be measured to measure a length of an arbitrary curve on a surface of the object to be measured includes a photographing unit for photographing the object to be measured from two or more different viewpoints to obtain a plurality of image data, a measuring point setting unit for setting, on a photographed image, a measuring point sequence along a curve to be measured, a curved surface calculation unit for setting parabolic half-lines directed from a predetermined reference point at a photographing position of the object to be measured by the photographing unit toward each measuring point sequence set by the measuring point setting unit and interpolating a group of half-lines to obtain a curved surface, an intersection calculation unit for obtaining an intersection between the plurality of said curved surfaces obtained by the curved surface calculation unit, and an intersection length calculation unit for obtaining a length of an intersection obtained by the processing by the intersection calculation unit.