The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2002

Filed:

Aug. 31, 2000
Applicant:
Inventor:

John Taylor, Jr., Clayton, NC (US);

Assignee:

Large Scale Proteomics Corp., Germantown, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

A computer-implemented method analyzes a scanned image of a 2-D electrophoresis gel producing spot specific data (SSD). The computer creates an object pattern of a suitably processed scanned image and uses the spot information in the object pattern in order to warp a master pattern into alignment with the object pattern (and hence the scanned image). The object pattern is replaced with the warped master pattern, augmented by addition of well-defined spots in the object image not present in the warped master pattern, and optimized to fit a processed version of the scanned image. This new object model thus contains identifying and relative position information from the master pattern and other spot specific data (SSD) from the old object model. The new object pattern thereby forms a basis upon which to compare the scanned image with other scanned images similarly processed.


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