The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2002

Filed:

Sep. 29, 2000
Applicant:
Inventors:

Bunjiro Ueki, Takatsuki, JP;

Toshiyuki Kato, Akishima, JP;

Hideaki Fujimoto, Takatsuki, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/3223 ; G01T 1/36 ;
U.S. Cl.
CPC ...
G01N 2/3223 ; G01T 1/36 ;
Abstract

An X-ray analyzing apparatus capable of accomplish a rapid and accurate analysis is provided in which a detector for X-rays is rotated or shuttled to perform a continuous scanning. Determining a counting time for each of fixed scanning intervals by means of a counting time counter and a frequency divider , correction of a count for each scanning interval is made by a correction calculating means on the basis of the corresponding counting time.


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