The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2002
Filed:
Dec. 29, 1999
Carl Pforr, Milwaukee, WI (US);
Hui David He, Waukesha, WI (US);
Sholom M. Ackelsberg, Ridgewood, NJ (US);
Xiangfeng Ni, Milwaukee, WI (US);
Chalapathy V. Dhanwada, Arlington Heights, IL (US);
Carlos F. Guerra, Lake Mills, WI (US);
Holly A. McDaniel, New Berlin, WI (US);
Gary R. Strong, Waukesha, WI (US);
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
Scalable multislice systems which, in one embodiment, includes a scalable multislice detector, a scalable data acquisition system (SDAS), scalable scan management, control, and image reconstruction processes, and a user interface, are described. More specifically, the user interface is implemented in a host computer for defining the configuration of the imaging system. Particularly, after selection of each scan parameter, the user interface displays the available scan parameter values for the remaining parameters so that the scan objectives are met. More specifically, after selection of each scan parameter, the user interface updates the remaining scan parameters, including prospective and retrospective image thicknesses.