The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2002
Filed:
Sep. 02, 1999
Shigehiro Shimada, Tokyo, JP;
Makoto Kawamura, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Abstract
Sampling points are set on a first closed curve which represents the contour of an object contained in an image. Sampling points are also set on a second closed curve which represents the object contour to be obtained after lapse of a predetermined time. Associate points are set on the first and second closed curves to correlate these closed curves. Interpolations are performed between the sampling points on both curves, starting from the associate points, thereby generating a transient contour which is to be obtained in the course of transition from the first closed curve to the second closed curve. This method enables the transient contour to be obtained with high quality, even if the first and second closed curves are constituted by different numbers of segments which are to be used in the generation of the transient contour.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile