The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2002
Filed:
Aug. 12, 2000
Jan Grinberg, Los Angeles, CA (US);
Robin Harvey, Thousand Oaks, CA (US);
Franklin A. Dolezal, Reseda, CA (US);
Raytheon Company, Lexington, MS (US);
Abstract
The system ( ) includes a first mechanism ( ) for receiving electromagnetic energy of a first wavelength from the scene ( ) and providing electromagnetic energy of a second wavelength shorter than the first wavelength. A second mechanism ( ) measures variations of the electromagnetic energy of the second wavelength over a predetermined area. The system is a millimeter wave imaging system ( ). The first mechanism ( ) includes a lens ( ) having an index of refraction substantially greater than . The lens ( ) is opaque to infrared electromagnetic energy and made of alumina, plastic, or other material having a relatively high index of refraction. The second mechanism ( ) includes and array of bolometers ( ) positioned parallel to an output aperture ( ) of the lens and within a distance of the output aperture ( ) that is much smaller than the second wavelength. A video controller ( ), a computer ( ), process video signals output from the array of bolometers ( ) to yield an image, which is displayed on a display ( ).