The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2002

Filed:

Apr. 04, 2001
Applicant:
Inventors:

Jeffrey L. Duerk, Avon Lake, OH (US);

Michael Wendt, Hoboken, NJ (US);

Ajit Shankaranaravanan, East Cleveland, OH (US);

Yiu-Cho Chung, Chicago, IL (US);

Jonathan S. Lewin, Beachwood, OH (US);

Elmar Merkle, Ulm, DE;

Assignee:

Case Western Reserve University, Cleveland, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 ;
U.S. Cl.
CPC ...
G01V 3/00 ;
Abstract

A method for correcting MRI motion artifacts and main field fluctuations. A series of data prints are acquired at read points along a radial axis to form a view ( ). Subsequent views define a NMR data set. A processor stores the NMR data set and reconstructs an image array from a stored NMR data set by; a) reconstructing the NMR data set along a radial axis; b) producing a correction data array including correction values where each of the correction values is calculated as a function of the corresponding stored NMR datum and the stored NMR datum for the intersection of the first and subsequent projection ( ) axes; c) applying the data in the correction array to the NMR data set to produce a final NMrR data set.


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