The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2002
Filed:
Dec. 22, 2000
Jonathan C. Boomgaarden, Waukesha, WI (US);
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
The present technique provides a method for calculating the source-to-image distance of an imaging system utilizing the intensity of the x-ray. The present technique involves measuring the source-to-image distance using the x-ray intensity and the inverse square relationship between the intensity and the distance. The present technique can be implemented with a digital detector system using fixed timing, relying on the measuring capability of the digital detector to determine intensity, or it can be implemented using a phototiming approach, using either a digital detector or a conventional ion chamber to measure total exposure.