The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2002

Filed:

Sep. 06, 2000
Applicant:
Inventors:

Wei Han, Missouri City, TX (US);

James Robert Birchak, Spring, TX (US);

Bruce H. Storm, Jr., Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/902 ;
U.S. Cl.
CPC ...
G01N 2/902 ;
Abstract

A method is provided for analyzing suspended particulate and liquid medium in a fluid stream by transmitting acoustic signals into the fluid, detecting scattered acoustic energy, and determining a parameter related to the density and compressibility of the fluid. In one embodiment, the fluid analysis tool comprises two transmitting transducers intermittently emitting acoustic signals, and two receiving transducers being differently azimuthally positioned with respect to the transmitters. The ratio of the amplitude of scattered signals measured by the two receivers as a result of emission from the first and second transmitters are used to calculate the parameter. In another embodiment, a tool comprising one transmitter and at least three receivers with azimuthal angles in both forward and backward scattering regions with respect to the incident wave is disclosed. The scattering signal amplitudes normalized by the amplitude from one of the receivers is used to identify and monitor the system.


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