The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2002
Filed:
Mar. 02, 1999
Applicant:
Inventors:
Sabine Schöniger, München, DE;
Peter Schrögmeier, München, DE;
Thomas Hein, München, DE;
Stefan Dietrich, Türkenfeld, DE;
Assignee:
Infineon Technologies AG, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/128 ; G01R 3/102 ; G11C 2/900 ;
U.S. Cl.
CPC ...
G01R 3/128 ; G01R 3/102 ; G11C 2/900 ;
Abstract
A test method suitable for testing at least one integrated circuit which, on a main area, has contact areas that serve to transfer signals during a first operating mode of the circuit. Only some of the contact areas are contact-connected to test contacts of a test apparatus and the circuit is put into a second operating mode in which the signals which are transferred via at least one of the non-contact-connected contact areas in the first operating mode are transferred via at least one of the contact-connected contact areas.