The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2002
Filed:
Jul. 20, 2001
Shigeki Yagi, Chiba, JP;
Seiko Instruments Inc., , JP;
Abstract
An X-ray fluorescence analyzer utilizing principles of an X-ray fluorescence method comprising X-ray generation means for generation of X-rays, a shutter for shielding against X-ray beam irradiation, generated by the X-ray generation means, to a sample to be measured, X-ray detection means for detecting secondary X-rays, generated as the result of X-ray beam irradiation, to a sample to be measured, measurement control instruction means for instructing to start and to stop measurement, operation delay means for outputting a signal to shutter actuating means after a fixed period of time has elapsed after the measurement start instruction signal from the measurement control instruction means is input, and display means for displaying that the X-ray fluorescence analyzer is performing measurement during the period when from the measurement start instruction signal is input from the measurement control instruction means until the measurement stop instruction signal is input.