The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2002

Filed:

Aug. 07, 2000
Applicant:
Inventors:

Toshiaki Fukunaga, Kaisei-machi, JP;

Mitsugu Wada, Kaisei-machi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 5/00 ;
U.S. Cl.
CPC ...
H01S 5/00 ;
Abstract

In a semiconductor laser device: an n-type lower cladding layer; a lower optical waveguide layer; a compressive strain quantum well active layer made of In Ga As P , where 0<x &lE;0.4 and 0&lE;y &lE;0.1; an upper optical waveguide layer; a p-type In Ga P first upper cladding layer; an etching stop layer made of In Ga As P , where 0&lE;x &lE;0.3 and 0&lE;y &lE;0.6; an n-type In Ga P current confinement layer; a p-type second upper cladding layer made of In Ga As P , where x &equals;(0.49&plusmn;0.01)y and 0.4&lE;x &lE;0.46; and a p-type contact layer are formed on an n-type GaAs substrate in this order. At least the current confinement layer has a stripe-shape opening realizing a current injection window filled with the second upper cladding layer. The absolute value of the product of the strain and the thickness of the compressive strain quantum well active layer is equal to or smaller than 0.25 nm; the absolute value of the product of the strain and the thickness of the etching stop layer is equal to or smaller than 0.25 nm; and each of the lower cladding layer, the lower optical waveguide layer, the upper optical waveguide layer, the first upper cladding layer, the current confinement layer, the second upper cladding layer, and the contact layer has such a composition as to lattice-match with the GaAs substrate.


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