The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2002

Filed:

Dec. 26, 2000
Applicant:
Inventors:

Yuko Mikuni, Tokyo, JP;

Takashi Kawabata, Tokyo, JP;

Norihiko Toyota, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04J 3/16 ; H04B 1/06 ;
U.S. Cl.
CPC ...
H04J 3/16 ; H04B 1/06 ;
Abstract

A first sector cell is set as an object for measurement (S ). Reception levels in each time slot in the number of TDMA-TDD frames is measured for the object cell (S ) and for all the cells (S and S ). The results of the measurement of a specific sector cell are added to the results of the measurement of a sector cell opposite the specific sector cell, and time slots in which control channels can be placed are extracted for each sector cell (S to S ). TDMA-TDD frames are then allocated such that the control channels of each sector cell coincide with time slots in which control channels can be placed (S ). In this way, control channels are placed in time slots such that a base station having a sector cell structure avoids interference from the same frequency.


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