The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2002

Filed:

Feb. 26, 2001
Applicant:
Inventors:

Allan Parker, Austin, TX (US);

Joseph Skrovan, Buda, TX (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 2/900 ;
U.S. Cl.
CPC ...
G11C 2/900 ;
Abstract

A method for testing a multi-level memory includes storing multi-level data in a plurality of memory cells of the multi-level memory and reading from configure registers initial values of a plurality of performance variables. The performance variables set operating parameters of the multi-level memory. The method further includes during a first test phase operating the multi-level memory at the initial values of the plurality of performance variables and reading program values of the plurality of performance variables. During a second test phase, the multi-level memory is operated at the program values of the plurality of performance variables.


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