The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2002
Filed:
Oct. 02, 2000
Martin M. Morici, Timonium, MD (US);
James R. Brinsley, Severna Park, MD (US);
Honeywell International Inc., Morristown, NJ (US);
Abstract
A method and apparatus which perform efficient projection of 4-dimensional data (3 spatial and 1 time dimension) onto planar grids are described. Multiple frames of data are drawn from a limited time history data buffer and projected onto a planar grid, which need not be flat, defined in its own coordinate system. Higher dimensional data structures can also be formed from multiple projection grids. Measurement data from multiple data frames is projected into the planar grid such that distance out of plane is the z-dimension. Computational efficiency is achieved by processing only those data samples that are relevant to the planar grid. To be considered relevant, the impulse response of the sensor's measurement rays must cross the planar grid. Samples of relevant rays must also map onto the planar grid's coordinate mesh to be relevant. Multiple data measurements may determine the planar grid's final amplitude result. Amplitudes at the planar grid coordinates are determined by the most relevant measurement(s) of those within the extent of the measurement system's impulse response.