The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2002

Filed:

Feb. 02, 2000
Applicant:
Inventors:

Wayne Harvey Knox, Holmdel, NJ (US);

Chunhui Xu, Piscataway, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/1302 ;
U.S. Cl.
CPC ...
G01R 3/1302 ;
Abstract

An electrooptic probe for measuring the voltage at regions of an ultra fast device under test includes a standard gallium arsenide substrate that includes on a front surface a film of LT GaAs whose surface includes a conductive stripe that includes first and second portions separated by a gap, the first portion for contacting the region under test, and the second portion for connection to a measuring instrument. The probe is irradiated with a pulsed beam of light, advantageously from a mode-locked femtosecond laser focused at the gap in the stripe and of appropriate two photons, for making conducting by two-photon absorption the region of the film underlying the gap. Preferably the beam irradiates the back surface of the probe to pass through its substrate to reach the gap. Alternatively the beam can irradiate the back surface of the device under test to reach the gap.


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