The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2002
Filed:
Dec. 17, 1999
Rosann M. Kaylor, Cumming, GA (US);
Abraham B. Choi, Duluth, GA (US);
Chibueze Obinna Chidebelu-Eze, East Point, GA (US);
Michael Heinrich Herbert Grunze, Neckargemund, DE;
Kimberly-Clark Worldwide, Inc., Neenah, WI (US);
Abstract
The present invention provides an inexpensive and sensitive system and method for detecting analytes present in a medium. The system comprises a diffraction enhancing element, such as functionalized microspheres, which are modified such that they are capable of binding with a target analyte. Additionally, the system comprises a polymer film, which may include a metal coating, upon which is printed a specific, predetermined pattern of a analyte-specific receptors. Finally, the system includes a wicking agent which permits the system to be a single step system which avoids the necessity of any additional rinsing steps. Upon attachment of a target analyte to select areas of the polymer film, either directly or with the diffraction enhancing element, diffraction of transmitted and/or reflected light occurs via the physical dimensions and defined, precise placement of the analyte. A diffraction image, such as a hologram, is produced which can be easily seen with the eye or, optionally, with a sensing device.