The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2002
Filed:
Feb. 04, 2000
Victor Il'ich Kopp, Flushing, NY (US);
Azriel Zelig Genack, New York, NY (US);
Chiral Photonics, Inc., Clifton, NJ (US);
Abstract
A defect causing a localized state is induced in a chiral structure composed of multiple chiral elements by twisting one element of the chiral structure with respect to the other elements along a common longitudinal axis such that directors of the element molecular layers that are in contact with one another are disposed at a particular “twist” angle therebetween, the twist angle being greater than a shift angle between directors of consecutive layers. The chiral twist structure may be utilized in a variety of applications such as filters, lasers and detectors. The defect caused by the twist may be made tunable by providing a tuning device for ly rotating one or more of the chiral elements with respect to one another to vary the twist angle and thus vary the position of the induced defect within a photonic stop band. Tunable defects may be advantageously utilized to construct wavelength tunable chiral filters, detectors and lasers.