The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2002
Filed:
Mar. 20, 2000
Applicant:
Inventors:
Maxim Martchevskii, Plainsboro, NJ (US);
Mark J. Higgins, Cranbury, NJ (US);
Sabyasachi Bhattacharya, New York, NY (US);
Assignee:
NEC Research Institute, Inc., Princeton, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/312 ;
U.S. Cl.
CPC ...
G01R 3/312 ;
Abstract
A scanning AC hall microscope and a method which measures the domain pattern of magnetic materials, such as magnetic storage media, by measuring the oscillatory motion of a domain boundary under the influence of an external applied AC magnetic field, which allows a differentiation between domains which are immobile and domains which are mobile.