The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2002
Filed:
Mar. 11, 1999
Applicant:
Inventor:
Jeffrey C. McCreary, Horseheads, NY (US);
Assignee:
Corning Incorporated, Corning, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 7/04 ;
U.S. Cl.
CPC ...
G02B 7/04 ;
Abstract
An inspection system for and a method of inspecting defects on opposite sides of a glass specimen are set forth wherein a focusing filament is positioned in the light path of an inspection system having an objective lens. The filament is focused to the same plane that the objective lens uses to image a defect on the glass surface, so as to produce a shadow of the filament in the field of view when the objective is focused on either a front or back surface of the specimen. The utilization of the focusing filament provides an absolute surface reference that can automatically compensate for variations of the glass specimen position relative to a plane.