The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2002
Filed:
Apr. 16, 1999
Harry Israel Ringermacher, Delanson, NY (US);
Donald Robert Howard, Troy, NY (US);
Ravindra Kumar Pandey, Albany, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
An IR transient thermography imaging system includes high-power flash lamps fitted with spectrally tuned optical filters and a focal-plane array camera for IR image data acquisition. The image data processing control computer analyzes acquired IR image data frames and provides a color-keyed display of an imaged object that correlates to object thickness over the imaged surface area. Acquisition of IR data is initiated at a firing of flash lamps used to heat a surface of the object along with a reference standard. A predetermined number of IR image frames are acquired and recorded over a predetermined period of time after firing of the lamps to develop a temperature-time (T-t) history of the object surface and the reference standard. A contrast curve is calculated for each pixel in the image frame, each pixel corresponding to an elemental region on the object surface. Gaussian temporal smoothing of contrast curve data is performed to improve signal-to-noise characteristics and a derivative of the contrast curve is determined using data points mathematically related to image frame number. All local peaks in the derivative of the contrast curve are identified and given significance according to a predetermined weighting function. The frame number of the most significant peak is used to determine time of occurrence of an “inflection point” in the contrast curve which is then used in determining object thickness. Gain correction of pixel intensity data is employed to offset IR emissivity variations caused by surface curvatures and varying surface conditions on an object.