The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2002
Filed:
Dec. 03, 1999
Bernard Patrick Bewlay, Schenectady, NY (US);
John Broddus Deaton, Jr., Niskayuna, NY (US);
Michael Francis Xavier Gigliotti, Jr., Scotia, NY (US);
Robert Snee Gilmore, Charlton, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
An ultrasonic inspection method for determining acceptability of material for microstructurally sensitive applications comprises providing a material, directing ultrasonic energy of ultrasonic inspection to the material; scattering reflected energy in the material; determining an amount of noise generated by the ultrasonic inspection; and characterizing the material as acceptable if the amount of noise corresponds to a pre-determined noise level. The invention also sets forth a system for implementing the method, as embodied by the invention.