The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2002

Filed:

Mar. 04, 1998
Applicant:
Inventors:

Masakazu Tanaka, Osaka, JP;

Masahiro Fukui, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

The present invention realizes the optimization of a transistor size with higher precision and in a shorter time, in designing a layout for an integrated circuit. A diffusion sharing estimation section estimates a diffusion-sharing region in the layout of the integrated circuit based on circuit data. A circuit characteristic evaluation section evaluates the characteristics, such as area, delay and power consumption, of the integrated circuit in accordance with the information about the diffusion-sharing region estimated by the diffusion sharing estimation section. A transistor size optimization section sets various size candidates for each of the transistors, which constitute the integrated circuit, provides these size candidates to the diffusion sharing estimation section and the circuit characteristic evaluation section, and then selects an optimum transistor size from the transistor size candidates thus set in accordance with the evaluation results obtained by the circuit characteristic evaluation section. Thus, a transistor size can be determined while taking the diffusion sharing into consideration. In addition, unlike a conventional method, it is no longer necessary to repeatedly re-determine a transistor size and perform a compaction.


Find Patent Forward Citations

Tanaka, Masakazu. (2002). Layout designing apparatus for integrated circuit, transistor size determining apparatus, circuit characteristic evaluating method, and transistor size determining method (U.S. Patent No. 6393601). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6393601

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