The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2002

Filed:

Sep. 24, 1998
Applicant:
Inventors:

Asawaree Kalavade, Aberdeen, NJ (US);

Pratyush Moghe, Aberdeen, NJ (US);

Assignee:

Lucent Technologies, Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/700 ;
U.S. Cl.
CPC ...
G06F 1/700 ;
Abstract

A method of evaluating an effect of a run-time scheduling policy on a performance of an end-system, having associated resources, running one or more applications, each application having one or more tasks and the tasks being mapped to the associated resources of the end-system, includes generating a state process having a state space representative of an evolution of computation associated with the end-system, the evolution being representative of task transitions with respect to the applications, available resources and the run-time scheduling policy. Then, given the state space generated with respect to, inter alia, the specified run-time scheduling policy, the method includes computing performance metrics from the state process, the performance metrics being representative of the effect of the run-time scheduling policy on the performance of the one or more applications running on the end-system. The method preferably calculates the performance in terms of the probability distribution of the processing delay of each application and a deadline miss probability.


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