The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2002
Filed:
Apr. 05, 1999
Martin Soika, Landshut, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
The invention discloses an evaluation method for the quality of measuring sensors of an autonomous mobile system. To this end, the plurality of sensors per cell that have surveyed this cell when surveying obstacles for producing a cellularly structured environment map are stored and it is identifiably indicated thereto which sensors have classified this cell in which way. For example, a occupied probability and a free probability is [sic] employed for the classification. The measuring quality is determined with reference to the results that the individual sensors have supplied or the respective cell. The extent to which the classifications of the individual sensors confirm one another is evaluated thereto. Sensors whose measured results deviate from a great number of other sensors are classified as faulty. In order to prevent dynamic objects in the environment from falsifying the quality statement, the system can implement a self-test in that it turns around its own axis within a static but not necessarily known environment and subsequently undertakes the evaluation of the sensors.