The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2002
Filed:
Apr. 22, 1998
Applicant:
Inventors:
Cassandra Turner Swain, Aberdeen, NJ (US);
Yao Wang, Matawan, NJ (US);
Assignee:
AT&T Corp., New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ; G06F 1/750 ;
U.S. Cl.
CPC ...
G06K 9/00 ; G06F 1/750 ;
Abstract
A method and apparatus provide a technique for generating a mesh based on an image view. The mesh includes a plurality of trapezoidal patches which can be used in a comparison operation with regard to a second co-planar image view. The comparison operation extracts disparity information between the patches of the respective images and these disparities can be used to calculate depth estimations for objects within the image of use.
Quick Actions:
Swain, Cassandra. (2002). Method and apparatus for adaptive stripe based patch matching for depth estimation (U.S. Patent No. 6393142). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6393142
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