The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2002
Filed:
Sep. 11, 1998
Akihito Nakayama, UE Square, SG;
Kenji Shintani, Singapore, SG;
Shunsuke Kohama, Chiba, JP;
Yukari Hashimoto, Yokohama, JP;
Other;
Abstract
The characteristic test device supplies the output from the photo detector of the optical pickup , as signals A to F, directly to the sample hold circuits . The sample hold circuits , the multiplexer , and the second analog/digital converting circuit convert the signals A to F into digital data with the sampling frequency of 50 KHz or more. In the computer , the processing division reads out the indicated program from the data storage division , where the program P for measuring the level of RF signal, is stored. The processing division performs the operation of the indicated measurement items, based on the digital data stored in the second memory , then measures the characteristic of the optical pickup