The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2002
Filed:
Sep. 13, 2000
Johann Engelhardt, Bad Schönborn, DE;
Heinrich Ulrich, Heidelberg, DE;
William C. Hay, Heppenheim, DE;
Leica Microsystems Heidelberg GmbH, Mannheim, DE;
Abstract
A laser scanning microscope, preferably a confocal laser scanning microscope, and a method for reference correction for a laser scanning microscope, in particular for a confocal laser scanning microscope, having an illumination beam path extending between a laser light source and a specimen, and a detection beam path extending between the specimen and a detection device, is characterized, for error correction with at least one reference beam path used for reference measurement, in that reference light can be coupled out of the illumination beam path into the reference beam path, and that the reference light is qualitatively and/or quantitatively detectable by a detection device.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile