The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2002

Filed:

Sep. 20, 2000
Applicant:
Inventors:

Masao Okubo, Tokyo, JP;

Dai Sasaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 3/017 ; H03K 5/04 ; H03K 7/08 ;
U.S. Cl.
CPC ...
H03K 3/017 ; H03K 5/04 ; H03K 7/08 ;
Abstract

When continuously outputted pulses from a first pulse to an (N+1)th (where N is an integer) are received, a pulse specifying circuit specifies a number N of a pulse whose properties are to be measured. Further, a gate generating circuit generates a gate signal which is at high level during a period from the end of the (N−1)th pulse to the start of the Nth pulse and which is at low level during a period from the end of the Nth pulse to the start of the (N+1)th pulse. A semiconductor evaluating apparatus measures the width of the Nth pulse based on the generated gate signal.


Find Patent Forward Citations

Okubo, Masao. (2002). Gate signal generating circuit, semiconductor evaluation apparatus, and semiconductor evaluating method (U.S. Patent No. 6392459). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6392459

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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