The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6391789 B1

PDF
Full Text
Expired
Date of Patent:
May. 21, 2002

Filed:

Apr. 17, 2001
Applicant:
Inventor:

Toshiaki Sango, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 2/1302 ;
U.S. Cl.
CPC ...
H01L 2/1302 ;
Abstract

A dry etching is carried out for a single semiconductor wafer electrostatically attracted to a static chuck in the presence of a plasma, wherein a controlling system applies a relatively large direct current voltage to the static chuck when a lapse of time from the previous dry etching is longer than a critical lapse of time and when a place occupied by the single semiconductor wafer in a lot is equal to or less than a critical place so that micro-contact holes formed over the semiconductor wafers in the lot are fallen within a target diameter range.


Find Patent Forward Citations

Sango, Toshiaki. (2002). Dry etching system for patterning target layer at high reproducibility and method of dry etching used therein (U.S. Patent No. 6391789). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6391789

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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