The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 21, 2002

Filed:

Sep. 22, 1998
Applicant:
Inventors:

David Y. Chien, Emeryville, CA (US);

Phillip Arcangel, Emeryville, CA (US);

Stephen Tirell, Emeryville, CA (US);

Wanda Zeigler, Emeryville, CA (US);

Assignee:

Chiron Corporation, Emeryville, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/70 ;
U.S. Cl.
CPC ...
C12Q 1/70 ;
Abstract

The present invention is directed to assays for detecting antibodies in a sample in a single incubation step. The assays employ universal solid phases and/or universal detectable markers, and facilitate the detection and differentiation of antigens from the same source or from different sources in a single test sample. The present invention includes test kits for performing the methods according to the invention.


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