The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 21, 2002
Filed:
Jan. 13, 2000
Applicant:
Inventors:
Nobutaka Nakamura, Chiba, JP;
Kanji Nagasawa, Chiba, JP;
Assignee:
Seiko Instruments Inc., , JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/500 ; G01K 5/00 ; G01K 1/700 ;
U.S. Cl.
CPC ...
G01N 2/500 ; G01K 5/00 ; G01K 1/700 ;
Abstract
Under a same heating condition as a sample to be measured, a physical property is measured for a reference substance whose temperature dependency of a physical property value is previously known. Reversely, a temperature profile of the reference substance is read so that the temperature profile is applied to a physical property measurement result for the sample. Thus, thermal analysis for the large diameter sample is made accurately without the necessity of arranging a temperature sensor in the vicinity of the sample.