The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2002
Filed:
Feb. 22, 1999
Applicant:
Inventor:
Hiroshi Muramatsu, Chiba, JP;
Assignee:
Seiko Instruments Inc., , JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 2/100 ;
U.S. Cl.
CPC ...
G02B 2/100 ;
Abstract
A probe for a near-field optical microscope was conceived in which a tube is thermally bent in the form of a hook; a microscopic aperture of the tube which has been thermally extended and cut away is provided at an end thereof; a part of the tube opposite to the microscopic aperture is removed to form an aperture at the removed portion to thereby provide a structure having no obstacle in the space between said aperture at the end and a near-field optical microscope utilizing the same was configured.
Muramatsu, Hiroshi. (2002). Probe for near-field optical microscope, method for manufacturing the same and scanning near-field optical microscope (U.S. Patent No. 6388239). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6388239
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile