The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2002

Filed:

Jun. 07, 1999
Applicant:
Inventor:

Izumi Hatakeyama, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 1/303 ;
U.S. Cl.
CPC ...
H03M 1/303 ;
Abstract

An ACS calculation is performed with received data and when the punctured process has not been performed, a trace-back process is performed in a loop. In this case, a punctured pattern of which data received at one time point, in those at three time points that have not been punctured, is used. Thus, the trace-back process is performed for the data at the time point. With the trace-back process performed once, decoded data at three time points including punctured data at two time points is generated. Since the trace-back process is not performed with punctured data as the start point, an error of decoded data can be prevented or suppressed.


Find Patent Forward Citations

Hatakeyama, Izumi. (2002). Punctured viterbi decoding method (U.S. Patent No. 6385753). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6385753

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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