The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2002
Filed:
Mar. 31, 2000
Wilmer L. Sibbitt, Albuquerque, NM (US);
William M. Brooks, Albuquerque, NM (US);
Helen Petropoulos, Albuquerque, NM (US);
Other;
Abstract
The present invention provides a method for determining whether an individual has a central nervous system disease or injury comprising: obtaining a T measurement for at least one brain tissue sample from an individual; determining if the T measurement indicates the presence of a central nervous system disease or injury in the individual. The present invention also provides a method for determining whether an individual has a central nervous system disease or injury comprising: obtaining a first T measurement using an MRI technique for a brain tissue sample from an individual at a first time; obtaining a second T measurement using an MRI technique for the brain tissue sample from the individual at a second time; and comparing the second T measurement to the first T measurement. In addition, the present invention provides a method for determining the effectiveness of a treatment for a central nervous system disease or injury comprising: obtaining a first T measurement using an MRI technique for a brain tissue sample from an individual at a first time; administering a first treatment to an individual; obtaining a second T measurement using the MRI technique for the brain tissue sample from the individual after administering the first treatment; and comparing the second T measurement to the first T measurement.