The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2002

Filed:

Aug. 27, 2001
Applicant:
Inventor:

Mark A. Scheuer, Williamson, NY (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 1/500 ;
U.S. Cl.
CPC ...
G03G 1/500 ;
Abstract

A method for determining a sensor field of view with respect to a test patch and aligning the test patch with the sensor field of view. The apparatus and method according to this invention additionally allows for utilizing the results of the determined field of view to aid in controlling the various system parameters of the image printing system.


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Scheuer, Mark. (2002). Detecting the location of a sensors field of view (U.S. Patent No. 6385408). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6385408

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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