The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2002
Filed:
Feb. 19, 1999
Applicant:
Inventors:
Abir Zahalka, London, CA;
Aaron Fenster, London, CA;
Assignee:
The John P. Roberts Research Institute, London, CA;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract
An ultrasound segmentation method comprising the steps of automated initial contour identification, followed by application of a geometrically deformable model (GDM). The formation of the initial contours involves the input of a single seed point by the user, and has been found to be insensitive to the placement of the seed within a structure. The GDM minimizes contour energy, providing a smoothed final result, with only three simple parameters being required as easily selectable input values.