The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2002

Filed:

Feb. 26, 1999
Applicant:
Inventor:

Katsuki Tamamura, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/04 ;
U.S. Cl.
CPC ...
H04N 1/04 ;
Abstract

An image scanning unit for correcting a variation in magnification caused by an inclination of optical visual-line between a manuscript and a photoelectric conversion element when a full-speed scan reciprocating bed and a half-speed scan reciprocating bed are scanned in the sub-scan direction. The image scanning unit has: an optical system that leads light reflected on the manuscript to the photoelectric conversion element; a marking that is disposed on the optical visual-line of the full-speed scan reciprocating bed; a light source that supplies light to the marking; and a control circuit for accumulating marking information that is input through the optical system to the photoelectric conversion element and detecting an inclination of optical visual-line by comparing the accumulated marking information and regular marking information at regular optical visual-line, and for canceling the variation in magnification in the sub-scan direction caused by the detected inclination of optical visual-line.


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