The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2002

Filed:

Dec. 07, 1999
Applicant:
Inventors:

Thilo Nass, Rutesheim, DE;

Frank Seidel, Stuttgart, DE;

Martin Noll, Muggensturm, DE;

Frank Hoenes, Ditzingen, DE;

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60Q 1/00 ;
U.S. Cl.
CPC ...
B60Q 1/00 ;
Abstract

An arrangement for detecting the presence of an obstacle in the vicinity of an object includes art least one transmitter that emits a pulsed signal from a predetermined location of the object, at least two receivers capable of receiving echoes of such a pulsed signal as reflected from the obstacle each at a different location of the object, and an evaluating device that measures respective time intervals elapsing between the emission of the pulsed signal and the receipt of the respective echo by the associated receiver. The evaluating device furthermore establishes the presence of the obstacle in a first environmental region of the object when either the time interval to a first one of the two locations is smaller than a first threshold or the time interval to a second one of the two locations is smaller than a second threshold, as well as the presence of the obstacle in a second environmental region of the object when the time interval to the first location is smaller than a third threshold exceeding the first threshold and the time interval to the second location is simultaneously greater than a fourth threshold exceeding the second threshold.


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