The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2002
Filed:
Sep. 08, 2000
Applicant:
Inventors:
Yoshiaki Kakino, Kyoto 606-0024, JP;
Makoto Fujishima, Yamatokoriyama, JP;
Hisashi Otsubo, Okayama, JP;
Hideo Nakagawa, Itami, JP;
Yoshinori Yamaoka, Aichi, JP;
Torao Takeshita, Tokyo, JP;
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/546 ;
U.S. Cl.
CPC ...
G06F 1/546 ;
Abstract
An abnormality detection apparatus for a tool ( ) is described for judging abnormalities of a tool by a uniformly set threshold value in relation to a cutting load even in a machining process wherein a feed rate changes every moment. The abnormalities of the tool can be judged by the uniformly set threshold value on the basis of the tool load wherefrom the feed load that fluctuates upon the feed rate has been removed.