The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2002
Filed:
Mar. 30, 2000
Applicant:
Inventors:
Michael W. Sprayberry, Austin, TX (US);
Leland F. Rusk, Austin, TX (US);
Assignee:
Advanced Micro Devices, Austin, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/126 ; H01L 2/166 ;
U.S. Cl.
CPC ...
G01R 3/126 ; H01L 2/166 ;
Abstract
A testing methodology for increasing the performance and reliability of integrated circuits (“chips”) outputted from a manufacturing process, utilizes a method by which the operating frequency of the integrated circuit is measured when the Self-Timed Pulse Control parameter is adjusted to provide a more strict test upon the chip. Under this more stringent test, the integrated circuits that do not pass the test then are designated as failures or marketed with listed lower operating frequencies.